IEC 61000-4-2 Accredited Testing Labs in United States
27 laboratories in United States are accredited by A2LA under ISO/IEC 17025 to perform IEC 61000-4-2 testing. Most frequently tested analytes via this method in United States: Esd Simulator Contact Discharge, Open Circuit Voltage. Accredited providers include Technical Maintenance, Inc. - PEACHTREE CORNERS, Technical Maintenance, Inc. - COLORADO SPRINGS, Bureau Veritas Consumer Products Services (Hong Kong) Ltd., Taoyuan Branch, SGS Taiwan, Bureau Veritas Shenzhen Co., Ltd. Dongguan Branch. Sites located in Peachtree Corners, GA, Colorado Springs, CO, Taoyuan City, Taoyuan, Dongguan City, Guangdong Province.
Accredited Labs
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 4327.01) 10/22/2025 Page 2 of 4 Test Technology: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC/EN 61000-4-2; BS EN 61000-4-2; EN IEC 61000-4-2; BS EN IEC 61000-4-2 Radiated Immunity IEC/EN 61000
(A2LA Cert. No. 7501.01) Revised 03/10/2026 Page 2 of 6 Test Technology: Test Method(s) 1,2: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2; EN 61000-4-2; BS EN 61000-4-2 R
(A2LA Cert. No. 2951.01) Revised 11/25/2025 Page 3 of 16 Test Technology: Test Method(s) 2: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2; EN 61000-4-2; GB/T 17626.2; AS/NZS 61000.4.2; CNS 14676-2; BS EN 61000-4-2; S
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 3483.01) 04/14/2025 Page 2 of 2 Test Technology: Test Method(s)1: Electrostatic Discharge (ESD) IEC 61000-4-2:1999, 2008; IEC
(A2LA Cert. No. 7131.01) 10/27/2025 Page 5 of 8 Test Technology: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2; EN 61000-4-2; BS EN 61000-4-2; SANS 61000-4-2 Radiated Immunity IEC 61000-4-3; EN 61000-4
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 3508.01) 10/14/2025 Page 2 of 3 Parameter/Equipment Range CMC2, 4 (±) Comments Transient Surge Generator3 – Open Circuit Voltage: Rise/Front Time Time to Half-Value Short Cir
(A2LA Cert. No. 2316.01) 09/18/2025 Page 2 of 3 Test Technology: Test Method(s)1: Conducted (continued) CNS 13438; CNS 15936 (2016); VCCI V-2, V-3, V-4; VCCI 32-1; VCCI-CISPR 32 (2016); TCVN 7189; QCVN 118:2018/BTTTT; EN 609
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 1007.01) 11/03/2025 Page 2 of 4 Test Technology: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2:2008 2; IEC 61000-4-2 2; KS C 9610-4-2; EN 61000-4-2:2009 2; EN 61000-4-2 2 Radiate
(A2LA Cert. No. 7136.01) 11/14/2025 Page 2 of 6 Test Technology: Test Method(s) 4: Immunity ESD BS EN 61000-4-2(2009)2; IEC 61000-4-2(2008)2; EN 61000-4-2(2009)2; SANS 61000-4-2 Radiated Immunity
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 0078.08) 12/17/2024 Page 1 of 4 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 INTERTEK TESTING SERVICES LTD., SHANGHAI Building T52-8, No. 1201 Gui Qiao Road Pudong District, Shanghai, 201206, People’s Repu
(A2LA Cert. No. 1427.01) 02/27/2026 Page 2 of 8 Test Technology: Test Method(s) 2,3: Immunity Electrostatic Discharge IEC 61000-4-2; EN 61000-4-2; KS C 9610-4-2 Radiated Immunity IEC 61000-4-3; EN 61000-4-3; KS C 9610-4-3
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 4312.01) 03/04/2026 Page 2 of 10 Test Technology: Test Method(s) 2: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2; EN 61000-4-2; BS EN 61000-4-2 Radiated, Radiofrequency, Electromagnetic Field (80 – 6000 M
Page 108 of 205 (A2LA Cert. No. 2348.01) Revised 03/04/2026 Parameter/Equipment Range CMC2 (±) Comment Location10 Surge Generator – Front Time (+/-) Risetime Open/Short Circuit (+/-) Time to Half Value (+/-) Open Circuit Vol
(A2LA Cert. No. 2541.01) Revised 05/09/2025 Page 2 of 8 Test Technology: Test Method(s)1: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2; EN 61000-4-2; EN IEC 61000-4-2; BS EN 61000-4-2; BS EN IEC 61000-4-2; AS/NZS IEC 6
(A2LA Cert. No. 1022.02) Revised 12/15/2025 Page 2 of 55 II. Device Specific Parameters Parameter/Equipment Range CMC2, 5, 8 (±) Comments ESD Simulator – Contact Discharge (Positive & Negative) Rise Time
Top analytes for IEC 61000-4-2 in United States
- Esd Simulator Contact Discharge (1)
- Open Circuit Voltage (1)
About ISO/IEC 17025 in United States
American Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.
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